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Difference between revisions of "Uniden Scanner Test Modes for the XT and P2 scanners"

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# Will Erase ALL Stored Systems
 
# Will Erase ALL Stored Systems
 
# Will overwrite stored tone outs
 
# Will overwrite stored tone outs
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* Return to [[Uniden scanner test modes]]
  
  

Revision as of 02:09, 26 June 2021

Test name Keys BC346XT BCD396XT BCT15X BCD996XT BCD325P2 BCD996P2
Backlight Test
Battery Save Tests
EEPROM Dump
Firmware Version
Frequency Bands Test
Frequency Step Tests
Initialize Memory (Documented) 1
Initialize Memory
Key Touch Test
LCD Pixels Test 2
Loads Test Frequencies in Memory
NWR-SAME Tests 3
On-Air Cloning Test
RS232C Loopback Test
Scan Rate Test 4
Systems Tests
Tone-Out Test 5


Notes
  1. Erases Memory
  2. Reverts to Key Touch Test
  3. Very Loud! Use caution
  4. Will Erase ALL Stored Systems
  5. Will overwrite stored tone outs


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