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Difference between revisions of "Uniden scanner test modes"

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|'''BC-RH96'''
 
|'''BC-RH96'''
 
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|BACKLIGHT TEST
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|Backlight Test
 
|6+9+Scan
 
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|BACKLIGHT TEST
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|6+9+L/O
 
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|BATT. SAVE TEST
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|Dump Test
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|EEPROM Dump
 
|1+3+L/O
 
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|1+9+Hold
 
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|X
 
|X
 
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|Initialize Memory
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|Initialize Memory (Documented)
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|2+9+Hold *
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|2+9+Hold
 
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|SCAN RATE TEST (NOTE: Will Erase ALL Stored Systems)
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|1+6+L/O
 
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|SCAN RATE TEST (NOTE: Will Erase ALL Stored Systems)
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|SCAN RATE TEST (NOTE: Will Erase ALL Stored Systems)
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|4+9+Hold
 
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|SCAN RATE TEST (NOTE: Will Erase ALL Stored Systems)
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|6+7+Hold
 
|6+7+Hold
 
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Revision as of 15:40, 5 April 2007

Test modes for Uniden scanners.

To enter a test mode, hold the indicated keys while powering-on the scanner.

In the column for each scanner model, an X will be in the row corresponding to each test verified to work for that scanner model. If you verify that a test works for a scanner model, please update this page.

Test name Keys BC246T BCD396T BCD996T BCT15 BR330T SC230 BC-RH96
Backlight Test 6+9+Scan X
Backlight Test 6+9+L/O X
Battery Save Tests 1+4+8 X
Battery Save Tests 1+5+8 X
Battery Save Tests 2+4+7 X
Battery Save Tests 2+4+8 X
Battery Save Tests 2+5+7 X
EEPROM Dump 1+3+L/O X
EEPROM Dump 1+9+Hold X X
EEPROM Dump 1+9+L/O X
EEPROM Dump 3+7+Hold X X
EEPROM Dump 3+7+L/O X
EEPROM Dump 7+9+Hold X
Firmware Version 2+5+9 X X
Firmware Version 2+6+8 X X
Firmware Version 2+6+9 X X
Firmware Version 3+5+8 X X
Firmware Version 3+5+9 X X
Firmware Version 3+6+8 X X
Frequency Bands Test 0+3+Hold X
Frequency Step Tests 1+5+9 X
Frequency Step Tests 1+6+8 X
Frequency Step Tests 2+4+9 X
Frequency Step Tests 2+6+7 X
Frequency Step Tests 3+4+8 X
Initialize Memory 2+3+L/O X
Initialize Memory (Documented) 2+9+Hold X X
Initialize Memory 2+9+L/O X
Initialize Memory 3+8+Hold X X
Initialize Memory 3+8+L/O X
Initialize Memory 8+9+Hold X
Key Touch Test 0+3+Scan X X
Key Touch Test 0+6+Hold X
LCD Pixels Test 0+1+9 X X X
LCD Pixels Test 0+3+7 X X X
LCD Pixels Test 2+9+.No X X
LCD Pixels Test 3+8+.No X X
Loads Test Frequencies in memory 2+6+L/O X
Loads Test Frequencies in memory 2+9+Scan X
Loads Test Frequencies in memory 3+5+L/O X
Loads Test Frequencies in memory 3+8+Scan X
Loads Test Frequencies in memory 5+9+Hold X
Loads Test Frequencies in memory 6+8+Hold X
NWR-SAME Tests 0+1+3 X
NWR-SAME Tests 0+3+.No X
NWR-SAME Tests 2+3+.No X
On-Air Cloning Test 0+1+2 X
On-Air Cloning Test 0+1+Func X
On-Air Cloning Test 0+2+.No X
On-Air Cloning Test 1+2+.No X
RS232C Loopback Test 0+1+Hold X
RS232C Loopback Test (use supplied cable for BC-RH96) 0+.No+Hold X X
Scan Rate Test (NOTE: Will Erase ALL Stored Systems) 1+6+L/O X
Scan Rate Test (NOTE: Will Erase ALL Stored Systems) 1+9+Scan X
Scan Rate Test (NOTE: Will Erase ALL Stored Systems) 3+4+L/O X
Scan Rate Test (NOTE: Will Erase ALL Stored Systems) 4+9+Hold X
Scan Rate Test (NOTE: Will Erase ALL Stored Systems) 6+7+Hold X
Systems Tests 1+2+9 X
Systems Tests 1+3+8 X
Systems Tests 1+8+9 X
Systems Tests 2+3+7 X
Systems Tests 2+7+9 X
Tone-Out Test Hold+Scan+L/O X
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