Difference between revisions of "Uniden scanner test modes"
From The RadioReference Wiki
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|'''BC-RH96''' | |'''BC-RH96''' | ||
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− | | | + | |Backlight Test |
|6+9+Scan | |6+9+Scan | ||
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− | | | + | |Backlight Test |
|6+9+L/O | |6+9+L/O | ||
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− | | | + | |Battery Save Tests |
|1+4+8 | |1+4+8 | ||
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− | | | + | |Battery Save Tests |
|1+5+8 | |1+5+8 | ||
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− | | | + | |Battery Save Tests |
|2+4+7 | |2+4+7 | ||
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− | | | + | |Battery Save Tests |
|2+4+8 | |2+4+8 | ||
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− | | | + | |Battery Save Tests |
|2+5+7 | |2+5+7 | ||
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− | |Dump | + | |EEPROM Dump |
|1+3+L/O | |1+3+L/O | ||
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− | |Dump | + | |EEPROM Dump |
|1+9+Hold | |1+9+Hold | ||
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|X | |X | ||
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− | |Dump | + | |EEPROM Dump |
|1+9+L/O | |1+9+L/O | ||
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− | |Dump | + | |EEPROM Dump |
|3+7+Hold | |3+7+Hold | ||
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|X | |X | ||
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− | |Dump | + | |EEPROM Dump |
|3+7+L/O | |3+7+L/O | ||
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− | |Dump | + | |EEPROM Dump |
|7+9+Hold | |7+9+Hold | ||
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− | |Initialize Memory | + | |Initialize Memory (Documented) |
− | |2+9+Hold | + | |2+9+Hold |
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|X | |X | ||
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− | |NWR-SAME | + | |NWR-SAME Tests |
|0+1+3 | |0+1+3 | ||
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− | |NWR-SAME | + | |NWR-SAME Tests |
|0+3+.No | |0+3+.No | ||
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− | |NWR-SAME | + | |NWR-SAME Tests |
|2+3+.No | |2+3+.No | ||
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− | |On-Air Test | + | |On-Air Cloning Test |
|0+1+2 | |0+1+2 | ||
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− | |On-Air Test | + | |On-Air Cloning Test |
|0+1+Func | |0+1+Func | ||
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− | |On-Air Test | + | |On-Air Cloning Test |
|0+2+.No | |0+2+.No | ||
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− | |On-Air Test | + | |On-Air Cloning Test |
|1+2+.No | |1+2+.No | ||
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|X | |X | ||
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− | | | + | |Scan Rate Test (NOTE: Will Erase ALL Stored Systems) |
|1+6+L/O | |1+6+L/O | ||
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− | | | + | |Scan Rate Test (NOTE: Will Erase ALL Stored Systems) |
|1+9+Scan | |1+9+Scan | ||
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− | | | + | |Scan Rate Test (NOTE: Will Erase ALL Stored Systems) |
|3+4+L/O | |3+4+L/O | ||
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− | | | + | |Scan Rate Test (NOTE: Will Erase ALL Stored Systems) |
|4+9+Hold | |4+9+Hold | ||
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− | | | + | |Scan Rate Test (NOTE: Will Erase ALL Stored Systems) |
|6+7+Hold | |6+7+Hold | ||
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Revision as of 15:40, 5 April 2007
Test modes for Uniden scanners.
To enter a test mode, hold the indicated keys while powering-on the scanner.
In the column for each scanner model, an X will be in the row corresponding to each test verified to work for that scanner model. If you verify that a test works for a scanner model, please update this page.
Test name | Keys | BC246T | BCD396T | BCD996T | BCT15 | BR330T | SC230 | BC-RH96 |
Backlight Test | 6+9+Scan | X | ||||||
Backlight Test | 6+9+L/O | X | ||||||
Battery Save Tests | 1+4+8 | X | ||||||
Battery Save Tests | 1+5+8 | X | ||||||
Battery Save Tests | 2+4+7 | X | ||||||
Battery Save Tests | 2+4+8 | X | ||||||
Battery Save Tests | 2+5+7 | X | ||||||
EEPROM Dump | 1+3+L/O | X | ||||||
EEPROM Dump | 1+9+Hold | X | X | |||||
EEPROM Dump | 1+9+L/O | X | ||||||
EEPROM Dump | 3+7+Hold | X | X | |||||
EEPROM Dump | 3+7+L/O | X | ||||||
EEPROM Dump | 7+9+Hold | X | ||||||
Firmware Version | 2+5+9 | X | X | |||||
Firmware Version | 2+6+8 | X | X | |||||
Firmware Version | 2+6+9 | X | X | |||||
Firmware Version | 3+5+8 | X | X | |||||
Firmware Version | 3+5+9 | X | X | |||||
Firmware Version | 3+6+8 | X | X | |||||
Frequency Bands Test | 0+3+Hold | X | ||||||
Frequency Step Tests | 1+5+9 | X | ||||||
Frequency Step Tests | 1+6+8 | X | ||||||
Frequency Step Tests | 2+4+9 | X | ||||||
Frequency Step Tests | 2+6+7 | X | ||||||
Frequency Step Tests | 3+4+8 | X | ||||||
Initialize Memory | 2+3+L/O | X | ||||||
Initialize Memory (Documented) | 2+9+Hold | X | X | |||||
Initialize Memory | 2+9+L/O | X | ||||||
Initialize Memory | 3+8+Hold | X | X | |||||
Initialize Memory | 3+8+L/O | X | ||||||
Initialize Memory | 8+9+Hold | X | ||||||
Key Touch Test | 0+3+Scan | X | X | |||||
Key Touch Test | 0+6+Hold | X | ||||||
LCD Pixels Test | 0+1+9 | X | X | X | ||||
LCD Pixels Test | 0+3+7 | X | X | X | ||||
LCD Pixels Test | 2+9+.No | X | X | |||||
LCD Pixels Test | 3+8+.No | X | X | |||||
Loads Test Frequencies in memory | 2+6+L/O | X | ||||||
Loads Test Frequencies in memory | 2+9+Scan | X | ||||||
Loads Test Frequencies in memory | 3+5+L/O | X | ||||||
Loads Test Frequencies in memory | 3+8+Scan | X | ||||||
Loads Test Frequencies in memory | 5+9+Hold | X | ||||||
Loads Test Frequencies in memory | 6+8+Hold | X | ||||||
NWR-SAME Tests | 0+1+3 | X | ||||||
NWR-SAME Tests | 0+3+.No | X | ||||||
NWR-SAME Tests | 2+3+.No | X | ||||||
On-Air Cloning Test | 0+1+2 | X | ||||||
On-Air Cloning Test | 0+1+Func | X | ||||||
On-Air Cloning Test | 0+2+.No | X | ||||||
On-Air Cloning Test | 1+2+.No | X | ||||||
RS232C Loopback Test | 0+1+Hold | X | ||||||
RS232C Loopback Test (use supplied cable for BC-RH96) | 0+.No+Hold | X | X | |||||
Scan Rate Test (NOTE: Will Erase ALL Stored Systems) | 1+6+L/O | X | ||||||
Scan Rate Test (NOTE: Will Erase ALL Stored Systems) | 1+9+Scan | X | ||||||
Scan Rate Test (NOTE: Will Erase ALL Stored Systems) | 3+4+L/O | X | ||||||
Scan Rate Test (NOTE: Will Erase ALL Stored Systems) | 4+9+Hold | X | ||||||
Scan Rate Test (NOTE: Will Erase ALL Stored Systems) | 6+7+Hold | X | ||||||
Systems Tests | 1+2+9 | X | ||||||
Systems Tests | 1+3+8 | X | ||||||
Systems Tests | 1+8+9 | X | ||||||
Systems Tests | 2+3+7 | X | ||||||
Systems Tests | 2+7+9 | X | ||||||
Tone-Out Test | Hold+Scan+L/O | X |