Difference between revisions of "Uniden scanner test modes"
From The RadioReference Wiki
(Add note concerning bcd396t being very similar to bcd996t/xt) |
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|6+9+Scan | |6+9+Scan | ||
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|1+4+8 | |1+4+8 | ||
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| − | |EEPROM Dump | + | |rowspan="6"|EEPROM Dump |
|1+3+L/O | |1+3+L/O | ||
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Revision as of 10:52, 10 July 2012
Test modes for Uniden scanners.
To enter a test mode, hold the indicated keys while powering-on the scanner.
In the column for each scanner model, an X will be in the row corresponding to each test verified to work for that scanner model. If you verify that a test works for a scanner model, please update this page.
(It is very likely almost all of the test modes verified for the BCD396T will also work on the BCD996T/XT models as well. Again, try it and if it works, mark it as working here.)
| Test name | Keys | BC246T | BCD396T | BCD996T | BCT15 | BR330T | SC230 | BC-RH96 |
| Backlight Test | 6+9+Scan | X | X | |||||
| 6+9+L/O | X | X | X | |||||
| Battery Save Tests | 1+4+8 | X | ||||||
| 1+5+8 | X | |||||||
| 2+4+7 | X | |||||||
| 2+4+8 | X | |||||||
| 2+5+7 | X | |||||||
| EEPROM Dump | 1+3+L/O | X | X | |||||
| 1+9+Hold | X | X | X | X | X | |||
| 1+9+L/O | X | |||||||
| 3+7+Hold | X | X | X | X | ||||
| 3+7+L/O | X | |||||||
| 7+9+Hold | X | |||||||
| Firmware Version | 2+5+9 | X | X | X | X | X | X | |
| 2+6+8 | X | X | X | X | ||||
| 2+6+9 | X | X | X | X | ||||
| 3+5+8 | X | X | X | X | ||||
| 3+5+9 | X | X | X | X | X | |||
| 3+6+8 | X | X | X | X | ||||
| Frequency Bands Test | 0+3+Hold | X | X | X | X | X | X | |
| Frequency Step Tests | 1+5+9 | X | X | X | X | X | ||
| Frequency Step Tests | 1+6+8 | X | X | X | X | |||
| Frequency Step Tests | 2+4+9 | X | X | X | X | |||
| Frequency Step Tests | 2+6+7 | X | X | X | X | |||
| Frequency Step Tests | 3+4+8 | X | X | X | X | |||
| Initialize Memory | 2+3+L/O | X | ||||||
| Initialize Memory (Documented) | 2+9+Hold | X | X | X | X | |||
| Initialize Memory | 2+9+L/O | X | ||||||
| Initialize Memory | 3+8+Hold | X | X | |||||
| Initialize Memory | 3+8+L/O | X | ||||||
| Initialize Memory | 8+9+Hold | X | ||||||
| Key Touch Test | 0+3+Scan | X | X | X | X | X | X | |
| Key Touch Test (Freq. step on BCT15) | 0+6+Hold | X | X | X | ||||
| LCD Pixels Test (Reverts to Key Touch Test) | 0+1+9 | X | X | X | X | X | X | X |
| LCD Pixels Test (Reverts to Key Touch Test) | 0+3+7 | X | X | X | X | X | X | X |
| LCD Pixels Test (Reverts to Key Touch Test) | 2+9+.No | X | X | X | X | X | ||
| LCD Pixels Test (Reverts to Key Touch Test) | 3+8+.No | X | X | X | X | X | ||
| Loads Test Frequencies in Memory (Freq. step on BCT15) | 2+6+L/O | X | X | X | ||||
| Loads Test Frequencies in Memory | 2+9+Scan | X | X | X | ||||
| Loads Test Frequencies in Memory | 3+5+L/O | X | X | X | ||||
| Loads Test Frequencies in Memory | 3+8+Scan | X | X | X | ||||
| Loads Test Frequencies in Memory | 5+9+Hold | X | X | |||||
| Loads Test Frequencies in Memory | 6+8+Hold | X | X | |||||
| NWR-SAME Tests (NOTE: Very Loud! Use CAUTION!) | 0+1+3 | X | X | X | X | X | ||
| NWR-SAME Tests (NOTE: Very Loud! Use CAUTION!) | 0+3+.No | X | X | X | X | |||
| NWR-SAME Tests (NOTE: Very Loud! Use CAUTION!) | 2+3+.No | X | X | X | X | |||
| On-Air Cloning Test | 0+1+2 | X | X | |||||
| On-Air Cloning Test | 0+1+Func | X | X | |||||
| On-Air Cloning Test | 0+2+.No | X | X | |||||
| On-Air Cloning Test | 1+2+.No | X | X | |||||
| RS232C Loopback Test | 0+1+Hold | X | X | |||||
| RS232C Loopback Test (Use Supplied Cable for BC-RH96) | 0+.No+Hold | X | X | X | ||||
| Scan Rate Test (NOTE: Will Erase ALL Stored Systems) | 1+6+L/O | X | ||||||
| Scan Rate Test (NOTE: Will Erase ALL Stored Systems) | 1+9+Scan | X | X | |||||
| Scan Rate Test (NOTE: Will Erase ALL Stored Systems) | 3+4+L/O | X | X | |||||
| Scan Rate Test (NOTE: Will Erase ALL Stored Systems) | 4+9+Hold | X | ||||||
| Scan Rate Test (NOTE: Will Erase ALL Stored Systems) | 6+7+Hold | X | X | |||||
| Systems Tests | 1+2+9 | X | X | X | X | |||
| Systems Tests | 1+3+8 | X | X | X | ||||
| Systems Tests | 1+8+9 | X | X | X | ||||
| Systems Tests | 2+3+7 | X | X | X | ||||
| Systems Tests | 2+7+9 | X | X | X | ||||
| Tone-Out Test (NOTE: Will Over-Write your Tone-Outs) | Hold+Scan+L/O | X |
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